The 58th IEEE/ACM International Symposium on Microarchitecture® (MICRO) will conduct artifact evaluation (AE) this year. AE has become a common practice in the systems community (OSDI, PLDI, PACT, MLSys), and has recently been successfully introduced to the architecture community, with ASPLOS conducting AE in the last six years, and MICRO doing so as well in 2021. We invite the authors of accepted MICRO 2025 papers to submit their artifacts to be assessed based on the ACM Artifact Review and Badging policy. Note that this submission is voluntary and will not influence the final decision regarding the papers.
The authors of accepted papers at MICRO 2025 will be invited to submit their artifacts according to the established submission guidelines. Submission will be then reviewed according to the reviewing guidelines. Papers that successfully go through AE will receive a set of ACM badges of approval printed on the papers themselves and available as meta information in the ACM Digital Library (it is now possible to search for papers with specific badges in ACM DL). Authors of such papers will have an option to include a two-page-max artifact appendix to their camera-ready paper. The optional artifact appendix pages will be free of charge.
An artifact submission consists of two parts:
Please submit your artifact on our submission site. When you submit, please provide details about the artifact's software and hardware requirements. This will be extremely helpful for the Artifact Evaluation Committee to find suitable reviewers.
There are major benefits to introducing AE in our conferences.
Artifact Evaluation Co-Chairs | Affiliation |
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Eojin Lee | Inha University |
Ting-Jung Chang | National Yang-Ming Chiao-Tung University |
Committee Member | Affiliation |
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Abdelrahman Hussein | Simon Fraser University |
Aman Sinha | Institute of Electronics, National Yang Ming Chiao Tung University |
Amel Fatima | University of Virginia |
Avilash Mukherjee | University of British Columbia |
Avinash Kumar | The University of Texas at Austin |
Chang Liu | Tsinghua University |
Changhun Oh | KAIST |
Deepanjali Mishra | Carnegie Mellon University |
Devansh Jain | University of Illinois at Urbana-Champaign (UIUC) |
Dongjae Lee | KAIST |
Dongwook Kim | Yonsei University |
Fei Gui | Tsinghua University |
Filippo Carloni | CNIT, Politecnico Di Milano |
Gaosheng Liu | University of Trento |
Giannis Roumpos | IMDEA Software Institute |
Helya Hosseini | University of Maryland |
Hyegang Son | Korea University |
Jianchao Yang | National University of Defense Technology |
Jinwoo Hwang | KAIST |
Joao Paulo Cardoso de Lima | Dresden University of Technology |
Jungwoo Kim | Stanford |
Juntaek Lim | KAIST |
Keisuke Kamahori | University of Washington |
Konstantinos Kanellopoulos | ETH Zurich |
Kyoungho Jeun | Inha University |
Le Qin | The Hong Kong University of Science and Technology (Guangzhou) |
Lucas Henrique Morais | Hewlett Packard Enterprise and Universitat Politècnica de Catalunya |
Committee Member | Affiliation |
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MKP Madushanka | General sir John kotelawala Defence University |
Manoj Vishwanathan | Purdue University |
Mehdi Safarpour | Oulu |
Mian Qin | Broadcom |
Ruihao Li | The University of Texas at Austin |
SONAM | Indraprastha Institute of Information Technology Delhi (IIITD) |
Saber Ganjisaffar | University of California, Riverside |
Sanjali Yadav | University of Maryland |
Seonjin Na | Georgia Tech |
Shashank Nag | The University of Texas at Austin |
Shengyu Fan | UCAS |
Sirajus Salekin | Extron Electronics |
Sungjun Cho | POSTECH |
Sunho Lee | KAIST |
Varun Darshana Parekh | The Pennsylvania State University |
Venkata Kalyan Tavva | Indian Institute of Technology Ropar |
Weihong Xu | EPFL |
Won Joon Yun | University of Texas at Austin |
Wonung Kim | KAIST |
Xianglong Deng | Institute of Information Engineering, Chinese Academy of Sciences |
Xin Zhang | Peking University |
YUAN FENG | UC MERCED |
Yankai Jiang | Northeastern University |
Yao Hsiao | Stanford University |
Yinan Xu | Institute of Computing Technology, Chinese Academy of Sciences |
Yuewen Hou | University of Michigan |
Zihan Chen | Rutgers University |